Imaging Ellipsometry
We cordially invite you to the Imaging Ellipsometry Satellite Meeting, a gathering of scientists and researchers who are interested in the latest developments and applications of imaging ellipsometry. This event aims to promote the exchange of ideas and the advancement of knowledge in the field of Imaging ellipsometry.
The meeting will be held on 18.09.2023 at same building (Solid 21) as WSE2023. The agenda will include oral presentations on various topics related to imaging ellipsometry. There will also be opportunities for networking and socializing with fellow attendees.
We believe that your presence and participation in this meeting will greatly contribute to the success of the event. We hope to see you there!
PROGRAM | ||
9:30 - 10:00 | Arrival & Registration | |
10:00 - 10:10 | Saul Vazquez-Miranda | Welcome |
10:10 - 10:35 | Peter Thiesen | Characterization of Single Crystal of Methylamonium-Lead-Bromide-Perovskite by Imaging Spectroscopy Ellipsometry |
10:35 - 10:50 | Markus Olbrich | Ultrafast imaging ellipsometry – principles and examples |
10:50 - 11:05 | Attila Sütő | High Lateral Resolution Optical Thickness Metrology in Industry |
11:05 - 11:35 | Coffee Break | |
11:35 - 11:50 | Sebastian Henn | Imaging ellipsometry for photonic guided mode detection |
11:50 - 12:15 | Matthias Duwe | Imaging Mueller Matrix Ellipsometry (IMME) |
12:15 - 12:40 | Yong-Woon Lim (Thomas) | Innovative Actual Process Management of Real Products using Imaging Spectroscopic Ellipsometry |
12:40 - 12:55 | Fried Miklos | 3-color ellipsometric mapping tool without moving parts |
12:55 - 13:00 | Saul Vazquez-Miranda | Closing Remarks |
13:00 - 14:00 | Lunch | |
14:00 - 15:00 | Shun Okano, Peter Thiesen | SIMON (Live Demo) |
Chair of the meeting: Saul Vazquez-Miranda